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You can use osc2xrd for transformation of primary diffraction 3D (X–Z–I) data obtained on diffractometers with a cylindrical detector Rigaku RAXIS Rapid II and DMAX (*.osc files) into standard X-ray 2D 2Θ–I profiles (*.xrd files) suitable for full-profile analysis by the Rietveld method.
This freeware can be used for correction of brightness irregularities (shadows) on SEM images (mostly BSE images) of flat samples...
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