User login
News
Mon, 03/28/2022 - 14:40
Fri, 11/01/2019 - 20:13
Wed, 10/24/2018 - 21:14
Wed, 10/03/2018 - 14:48
Thu, 08/17/2017 - 13:17
You can use osc2xrd for transformation of primary diffraction 3D (X–Z–I) data obtained on diffractometers with a cylindrical detector Rigaku RAXIS Rapid II and DMAX (*.osc files) into standard X-ray 2D 2Θ–I profiles (*.xrd files) suitable for full-profile analysis by the Rietveld method.
This freeware can be used for correction of brightness irregularities (shadows) on SEM images (mostly BSE images) of flat samples...
If you like these programs and want to support their development, you can make a donation here